WO2025136728 - IN-TRACK AND CROSS-TRACK STITCHING ERROR CORRECTIONS
National phase entry is expected:
Publication Number
WO/2025/136728
Publication Date
26.06.2025
International Application No.
PCT/US2024/059275
International Filing Date
10.12.2024
Title **
[English]
IN-TRACK AND CROSS-TRACK STITCHING ERROR CORRECTIONS
[French]
CORRECTIONS D'ERREURS D'ASSEMBLAGE RECTILIGNE ET TRANSVERSAL
Applicants **
EASMAN KODAK COMPANY
Inventors
MADER, Rodney G.
LUDWICKI, John E.
Priority Data
18/390,140
20.12.2023
US
18/390,150
20.12.2023
US
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
| * | |
| Number of Office Actions | * |
| * | |
International Searching Authority |
EPO
* |
| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
* |
| Type of Assignment |
The Standard Agent's Assignment
* |
| Applicant's Legal Status |
Legal Entity
* |
| * | |
| * | |
| * | |
| * | |
| * | |
| Entry into National Phase under |
Chapter I
* |
| Patent Delivery |
Send the Letters Patent by Courier
* |
| Translation |
|
* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2604 | |
| EPO | Filing, Examination, Granting | 12149 | |
| Japan | Filing, Examination, Granting | 2309 | |
| South Korea | Filing, Examination, Granting | 2418 | |
| USA | Filing, Examination, Granting | 4740 |
Total:
24,220
The term for entry into the National Phase has expired. This quotation is for informational purposes only
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Abstract[English]
of overlapping jetting modules. In a first feature of the invention first and second test patterns are printed and analyzed to determine an aim stich gap that minimizes a visibility of a stitch boundary. In a second feature of the invention first and second test patterns are printed and analyzed to determine a stitch score that represents a degree of alignment between a slot with a slot width a bar with a bar width.[French]
de modules d'éjection se chevauchant. Dans une première caractéristique de l'invention, des premier et second motifs de test sont imprimés et analysés pour déterminer un objectif d'espace d'assemblage qui réduit au minimum une visibilité d'une limite d'assemblage. Dans une seconde caractéristique de l'invention, des premier et second motifs de test sont imprimés et analysés pour déterminer un score d'assemblage qui représente un degré d'alignement entre une fente dotée d'une largeur de fente et une barre dotée d'une largeur de barre.