WO2024220945 - SYSTEM AND METHODS TO ACCURATELY MEASURE DYNAMIC RESISTANCE FOR POWER DEVICES
National phase entry:
Publication Number
WO/2024/220945
Publication Date
24.10.2024
International Application No.
PCT/US2024/025592
International Filing Date
19.04.2024
Title **
[English]
SYSTEM AND METHODS TO ACCURATELY MEASURE DYNAMIC RESISTANCE FOR POWER DEVICES
[French]
SYSTÈME ET PROCÉDÉS DE MESURE PRÉCISE DE RÉSISTANCE DYNAMIQUE DE DISPOSITIFS DE PUISSANCE
Applicants **
TEKTRONIX, INC.
Inventors
HEGDE, Niranjan, R
KNIERIM, Daniel, G.
SHIVARAM, Vivek
SRI, Krishna, N H
O'BRIEN, Joshua, J.
B., Shubha
PAI, Yogesh M.
Priority Data
63/607,025
06.12.2023
US
202321028782
20.04.2023
IN
202321043710
29.06.2023
IN
202321065294
28.09.2023
IN
Application details
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International Searching Authority |
MOIP
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| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
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| Applicant's Legal Status |
Legal Entity
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| * | |
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| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| Translation |
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Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2609 | |
| EPO | Filing, Examination, Granting | 16419 | |
| Japan | Filing, Examination, Granting | 2431 | |
| South Korea | Filing, Examination, Granting | 2146 | |
| USA | Filing, Examination, Granting | 6140 |
Total:
29,745
The term for entry into the National Phase has expired. This quotation is for informational purposes only
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Abstract[English]
A test and measurement system includes a device under test (DUT) interface structured to couple to at least one DUT and a measurement instrument coupled to the interface. The instrument includes one or more processors configured to, when testing the DUT, accept a measurement signal at a first input channel and generate a first sample waveform from the measurement signal using a first set of parameters, accept the measurement signal at a second input channel and generate a second sample from the measurement signal using a second set of parameters, and generate a measurement waveform from a combination of the first sample waveform and the second sample waveform. Additionally, the measurement instrument is structured to determine settling errors in the first pulse of a double-pulse test, and then compensate measurements made in subsequent pulses for the settling errors.[French]
L'invention concerne un système de test et de mesure, comprenant une interface de dispositif sous test structurée pour de coupler à au moins un dispositif sous test et un instrument de mesure couplé à l'interface. L'instrument comprend un ou plusieurs processeurs configurés pour, lors du test du dispositif sous test, accepter un signal de mesure sur un premier canal d'entrée et générer un premier échantillon de forme d'onde à partir du signal de mesure à l'aide d'un premier ensemble de paramètres, accepter le signal de mesure sur un second canal d'entrée et générer un second échantillon à partir du signal de mesure à l'aide d'un second ensemble de paramètres, et générer une forme d'onde de mesure à partir d'une combinaison des premier et second échantillons de forme d'onde. De plus, l'instrument de mesure est structuré pour déterminer des erreurs d'établissement dans la première impulsion d'un test à double impulsion, puis pour compenser les erreurs d'établissement des mesures effectuées lors des impulsions suivantes.