WO2023053041 - DEFLECTOR GATES FOR ION BEAM INTENSITY MODULATION
National phase entry:
Publication Number
WO/2023/053041
Publication Date
06.04.2023
International Application No.
PCT/IB2022/059261
International Filing Date
28.09.2022
Title **
[English]
DEFLECTOR GATES FOR ION BEAM INTENSITY MODULATION
[French]
GRILLES DE DÉVIATION POUR MODULATION D'INTENSITÉ DE FAISCEAU D'IONS
Applicants **
DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
Inventors
HAUFLER, Robert
LOYD, William
Priority Data
63/249,944
29.09.2021
US
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
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| Number of Office Actions | * |
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International Searching Authority |
EPO
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| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
* |
| Applicant's Legal Status |
Legal Entity
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| * | |
| * | |
| * | |
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| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| Translation |
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* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2276 | |
| EPO | Filing, Examination, Granting | 11053 | |
| Japan | Filing, Examination, Granting | 2307 | |
| South Korea | Filing, Examination, Granting | 2385 | |
| USA | Filing, Examination, Granting | 4740 |
Total:
22,761
The term for entry into the National Phase has expired. This quotation is for informational purposes only
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Abstract[English]
In one aspect, a mass spectrometer is disclosed, which includes an ion path along which an ion beam can propagate, and an ion beam deflector positioned in the ion path and configured to modulate transfer of an ion beam received from an upstream section of the ion path to a downstream section thereof, said ion beam deflector comprising at least one electrically conductive electrode positioned relative to one another to provide an opening through which the ion beam can pass, where the two electrodes are electrically insulated relative to one another so as to allow maintaining each electrode at a DC potential independent of a DC potential at which the other electrode is maintained.[French]
Selon un aspect de l'invention, l'invention concerne un spectromètre de masse, qui comprend un trajet d'ions le long duquel un faisceau d'ions peut se propager, et un déflecteur de faisceau d'ions positionné dans le trajet d'ions et configuré pour moduler le transfert d'un faisceau d'ions reçu à partir d'une section amont du trajet d'ions vers une section aval de celui-ci, ledit déflecteur de faisceau d'ions comprenant au moins une électrode électriquement conductrice positionnée l'une par rapport à l'autre pour fournir une ouverture à travers laquelle le faisceau d'ions peut passer, les deux électrodes étant isolées électriquement l'une par rapport à l'autre de manière à permettre le maintien de chaque électrode à un potentiel CC indépendant d'un potentiel CC auquel l'autre électrode est maintenue.