WO2023047366 - SYSTEMS AND METHODS FOR SIGNAL DECONVOLUTION FOR NON-CONTACT SAMPLE EJECTION
National phase entry:
Publication Number
WO/2023/047366
Publication Date
30.03.2023
International Application No.
PCT/IB2022/059054
International Filing Date
23.09.2022
Title **
[English]
SYSTEMS AND METHODS FOR SIGNAL DECONVOLUTION FOR NON-CONTACT SAMPLE EJECTION
[French]
SYSTÈMES ET PROCÉDÉS DE DÉCONVOLUTION DE SIGNAL POUR ÉJECTION D'ÉCHANTILLON SANS CONTACT
Applicants **
DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
Inventors
IVOSEV, Gordana
LIU, Chang
Priority Data
63/247,344
23.09.2021
US
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
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International Searching Authority |
EPO
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| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
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| Applicant's Legal Status |
Legal Entity
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| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| Translation |
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Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2221 | |
| EPO | Filing, Examination, Granting | 11234 | |
| Japan | Filing, Examination, Granting | 2338 | |
| South Korea | Filing, Examination, Granting | 2448 | |
| USA | Filing, Examination, Granting | 4940 |
Total:
23,181
The term for entry into the National Phase has expired. This quotation is for informational purposes only
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Abstract[English]
A method for determining a convolved peak intensity in a sample trace includes ejecting a plurality of sample ejections from a sample well plate. An ejection time log is generated which includes an ejection time of each of the plurality of sample ejections from the sample well plate. The plurality of sample ejections is analyzed with a mass analyzer. The sample trace of intensity versus time values is produced for the plurality of sample ejections based on the analysis. A known peak shape is obtained. A convolved peak intensity is determined for a convolved peak of the sample trace based at least in part on the known peak shape and the ejection time log.[French]
L'invention concerne un procédé servant à déterminer une intensité de pic convolué dans une trace d'échantillon, consistant à éjecter une pluralité d'éjections d'échantillon d'une plaque de puits d'échantillon. Un journal de temps d'éjection est généré, ledit journal comprenant le temps d'éjection pour chaque éjection d'échantillon de la plaque de puits d'échantillon. La pluralité d'éjections d'échantillon est analysée avec un analyseur de masse. La trace d'échantillon de valeurs d'intensité par rapport au temps est produite pour la pluralité d'éjections d'échantillon en fonction de l'analyse. Une forme de pic connue est obtenue. Une intensité de pic convolué est déterminée pour un pic convolué de la trace d'échantillon en fonction, au moins en partie, de la forme de pic connue et du journal de temps d'éjection.