WO2023007383 - IMPROVING HEAT DISSIPATION AND ELECTRICAL ROBUSTNESS IN A THREE-DIMENSIONAL PACKAGE OF STACKED INTEGRATED CIRCUITS

National phase entry is expected:
Publication Number WO/2023/007383
Publication Date 02.02.2023
International Application No. PCT/IB2022/056920
International Filing Date 27.07.2022
Title **
[English] IMPROVING HEAT DISSIPATION AND ELECTRICAL ROBUSTNESS IN A THREE-DIMENSIONAL PACKAGE OF STACKED INTEGRATED CIRCUITS
[French] AMÉLIORATION DE LA DISSIPATION DE CHALEUR ET DE LA ROBUSTESSE ÉLECTRIQUE DANS UN BOÎTIER TRIDIMENSIONNEL DE CIRCUITS INTÉGRÉS EMPILÉS
Applicants **
MARVELL ASIA PTE LTD Tai Seng Centre 3 Irving Road, #10-01 Singapore 369522, SG
Inventors
PATEL, Janak G. 30 Whiteface Street South Burlington, Vermont 05403, US
NAYINI, Manish 5414 Princess Circle Wappingers Falls, New York 12590, US
GRAF, Richard S. 10 Friendship Drive Gray, Maine 04039, US
HABIB, Nazmul 1702 Main Street Colchester, Vermont 05446, US
Priority Data
63/227,185   29.07.2021   US
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Quotation for National Phase entry

Country StagesTotal
China Filing1544
EPO Filing, Examination9862
Japan Filing589
South Korea Filing575
USA Filing, Examination4710
MasterCard Visa

Total: 17280

The term for entry into the National Phase has expired. This quotation is for informational purposes only

Abstract[English] An electronic device (66), including a substrate (33) and a stack of dies stacked on the substrate. The stack of dies includes: (a) one or more functional dies (12, 13, 14, 15), the functional dies (12, 13, 14, 15) including functional electronic circuits and being configured to exchange electrical signals at least with the substrate (33), and (b) one or more dummy dies (88, 99), the dummy dies (88, 99) being disposed among dies forming the stack and being configured to: (i) dissipate heat generated by the one or more functional dies (12, 13, 14, 15) and (ii) pass electrical signals exchanged between the substrate (33) and the one or more functional dies (12, 13, 14, 15) or between two or more of the functional dies (12, 13, 14, 15).[French] L'invention concerne un dispositif électronique (66), comprenant un substrat (33) et un empilement de puces empilées sur le substrat. L'empilement de puces comprend : (A) une ou plusieurs puces fonctionnelles (12, 13, 14, 15), les puces fonctionnelles (12, 13, 14, 15) comprenant des circuits électroniques fonctionnels et étant configurées pour échanger des signaux électriques au moins avec le substrat (33), et (b) une ou plusieurs puces factices (88, 99), les puces factices (88, 99) étant disposées parmi des puces formant l'empilement et étant configurées pour : (I) dissiper la chaleur générée par l'au moins matrices fonctionnelles (12, 13, 14, 15) et (ii) faire passer des signaux électriques échangés entre le substrat (33) et l'ou les matrices fonctionnelles (12, 13, 14, 15) ou entre au moins deux des matrices fonctionnelles (12, 13, 14, 15).
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