WO2023026095 - DEVICE PERFORMANCE PREDICTION USING MATERIAL PROPERTIES
National phase entry:
Publication Number
WO/2023/026095
Publication Date
02.03.2023
International Application No.
PCT/IB2022/000476
International Filing Date
23.08.2022
Title **
[English]
DEVICE PERFORMANCE PREDICTION USING MATERIAL PROPERTIES
[French]
PRÉDICTION DE LA PERFORMANCE D'UN DISPOSITIF À L'AIDE DES PROPRIÉTÉS DE MATÉRIAUX
Applicants **
KROMEK GROUP, PLC
Netpark, Thomas Wright Way
Country Durham
Sedgefield TS21 3FD, GB
Inventors
RADLEY, Ian
Netpark, Thomas Wright Way
Country Durham
Sedgefield TS21 3FD, GB
LI, Handong
143 Zehner School Road
Zelienople, PA 16063, US
HARRIS, Brian, William
143 Zehner School Road
Zelienople, PA 16063, US
BRUNETTA, Carl, D.
143 Zehner School Road
Zelienople, PA 16063, US
Priority Data
63/235,985
23.08.2021
US
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
| * | |
| * | |
International Searching Authority |
EPO
* |
| Applicant's Legal Status |
Legal Entity
* |
| * | |
| * | |
| * | |
| * | |
| Entry into National Phase under |
Chapter I
* |
| Translation |
|
Recalculate
* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing | 1253 | |
| EPO | Filing, Examination | 6201 | |
| Japan | Filing | 587 | |
| South Korea | Filing | 574 | |
| USA | Filing, Examination | 2710 |
Total: 11325 USD
The term for entry into the National Phase has expired. This quotation is for informational purposes only
Abstract[English]
One embodiment provides a method for predicting the performance of a device based upon parameters of an underlying material, comprising: measuring a predetermined parameter of a material to be used in manufacturing the device; identifying, from a value generated from the measuring, a value of a property of the material; and determining a predicted performance of the device by correlating the value of the property to a performance value. Other aspects are described and claimed.[French]
L'invention concerne, selon un mode de réalisation, un procédé de prédiction de la performance d'un dispositif sur la base de paramètres d'un matériau sous-jacent, consistant en : la mesure d'un paramètre prédéterminé d'un matériau à utiliser dans la fabrication du dispositif; l'identification, à partir d'une valeur générée par la mesure, d'une valeur d'une propriété du matériau; et la détermination d'une performance prédite du dispositif par corrélation entre la valeur de la propriété et une valeur de performance. D'autres aspects sont décrits et revendiqués.