WO2024256558 - PICK-AND-PLACE APPARATUS WITH FORCE MEASUREMENT AND CORRESPONDING PICKING AND PLACING METHODS
National phase entry:
Publication Number
WO/2024/256558
Publication Date
19.12.2024
International Application No.
PCT/EP2024/066407
International Filing Date
13.06.2024
Title **
[English]
PICK-AND-PLACE APPARATUS WITH FORCE MEASUREMENT AND CORRESPONDING PICKING AND PLACING METHODS
[French]
APPAREIL DE TRANSFERT AVEC MESURE DE LA FORCE ET PROCÉDÉS DE TRANSFERT CORRESPONDANTS
Applicants **
NEXPERIA B.V.
Inventors
LIU, Yazhao
GOOSEN, Johannes Frans Lodewijk
VAN DER VEEN, Gijs
Priority Data
23178969.4
13.06.2023
EP
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
| * | |
| Number of Office Actions | * |
| * | |
International Searching Authority |
EPO
* |
| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
* |
| Type of Assignment |
The Standard Agent's Assignment
* |
| Applicant's Legal Status |
Legal Entity
* |
| * | |
| * | |
| * | |
| * | |
| * | |
| Entry into National Phase under |
Chapter I
* |
| Patent Delivery |
Send the Letters Patent by Courier
* |
| Translation |
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* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2050 | |
| EPO | Filing, Examination, Granting | 8175 | |
| Japan | Filing, Examination, Granting | 2183 | |
| South Korea | Filing, Examination, Granting | 2020 | |
| USA | Filing, Examination, Granting | 4740 |
Total:
19,168
The term for entry into the National Phase has expired. This quotation is for informational purposes only
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Abstract[English]
-th order light beam.[French]
ième ordre détecté.