WO2023166065 - SCANNING LIGHT MICROSCOPY METHOD, SCANNING LIGHT MICROSCOPE AND COMPUTER PROGRAM
National phase entry:
Publication Number
WO/2023/166065
Publication Date
07.09.2023
International Application No.
PCT/EP2023/055197
International Filing Date
01.03.2023
Title **
[English]
SCANNING LIGHT MICROSCOPY METHOD, SCANNING LIGHT MICROSCOPE AND COMPUTER PROGRAM
[French]
PROCÉDÉ DE MICROSCOPIE OPTIQUE À BALAYAGE, MICROSCOPE OPTIQUE À BALAYAGE ET PROGRAMME INFORMATIQUE
Applicants **
ABBERIOR INSTRUMENTS GMBH
Inventors
HARKE, Benjamin
SCHMIDT, Roman
Priority Data
22160107.3
03.03.2022
EP
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
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| Number of Office Actions | * |
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International Searching Authority |
EPO
* |
| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
* |
| Applicant's Legal Status |
Legal Entity
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| * | |
| * | |
| * | |
| * | |
| * | |
| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| Translation |
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* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2076 | |
| EPO | Filing, Examination, Granting | 8431 | |
| Japan | Filing, Examination, Granting | 2251 | |
| South Korea | Filing, Examination, Granting | 2249 | |
| USA | Filing, Examination, Granting | 4740 |
Total:
19,747
The term for entry into the National Phase has expired. This quotation is for informational purposes only
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Abstract[English]
The invention relates to a scanning light microscopy method comprising illuminating a sample (2) with illumination light, scanning a focused light distribution of the illumination light over or through the sample (2) by means of a scanner (4) comprising adjustable control parameters, and detecting light emitted by light-emitting entities in the sample (2) in response to the illumination light to obtain an image of the sample (2) or to obtain a localization map (22) of single light-emitting entities in the sample (2), wherein the method is performed by a scanning light microscope (1) which is operable in at least two different operation modes, and wherein the method comprises adjusting the control parameters of the scanner (4) dependent on the operation mode, in which the scanning light microscope (1) is operated. The invention further relates to a scanning light microscope (1) and a computer program for performing the method.[French]
L'invention concerne un procédé de microscopie optique à balayage comprenant l'éclairage d'un échantillon (2) avec une lumière d'éclairage, le balayage d'une distribution de lumière focalisée de la lumière d'éclairage sur ou à travers l'échantillon (2) au moyen d'un scanner (4) comprenant des paramètres de commande réglables, et la détection de la lumière émise par des entités électroluminescentes dans l'échantillon (2) en réponse à la lumière d'éclairage pour obtenir une image de l'échantillon (2) ou pour obtenir une carte de localisation (22) d'entités électroluminescentes uniques dans l'échantillon (2), le procédé étant réalisé par un microscope optique à balayage (1) qui peut fonctionner dans au moins deux modes de fonctionnement différents, et le procédé comprenant l'ajustement des paramètres de commande du scanner (4) en fonction du mode de fonctionnement, dans lequel le microscope optique à balayage (1) est actionné. L'invention concerne en outre un microscope optique à balayage (1) et un programme informatique pour mettre en oeuvre le procédé.