WO2026025561 - POLISHING METHOD AND POLISHING APPARATUS
National phase entry is expected:
Publication Number
WO/2026/025561
Publication Date
05.02.2026
International Application No.
PCT/CN2024/113509
International Filing Date
21.08.2024
Title **
[English]
POLISHING METHOD AND POLISHING APPARATUS
[French]
PROCÉDÉ DE POLISSAGE ET APPAREIL DE POLISSAGE
[Chinese]
抛光方法及抛光装置
Applicants **
SHANGHAI CHUANXIN SEMICONDUCTOR CO., LTD.
Inventors
JI, Minghua
Priority Data
202411053353.8
01.08.2024
CN
Application details
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International Searching Authority |
CNIPA
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| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
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| Applicant's Legal Status |
Legal Entity
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| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| Translation |
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Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 1720 | |
| EPO | Filing, Examination, Granting | 11558 | |
| Japan | Filing, Examination, Granting | 2153 | |
| South Korea | Filing, Examination, Granting | 2137 | |
| USA | Filing, Examination, Granting | 4740 |

Total:
22,308
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Abstract[English]
A polishing apparatus and a polishing method. The polishing method comprises the following steps: placing a substrate to be polished in a polishing chamber; adding a non-chemically active and abrasive-free polishing fluid to the polishing chamber, and enabling the substrate to be immersed in the polishing fluid, such that the polishing fluid exerts a vertical fluid pressure on the surface of the substrate; moving the substrate within a plane in which the surface of the substrate is located, such that the polishing fluid performs fluid-induced cutting on a protrusion on the surface of the substrate; and keeping the polishing fluid continuously performing fluid-induced cutting on the protrusion to remove the protrusion, thereby achieving polishing of the surface of the substrate. The present invention can avoid damage to surfaces of substrates caused by polishing, thereby effectively protecting the substrates, effectively improving the polishing quality, and achieving high-precision polishing. Correspondingly, the present invention also provides a polishing apparatus.[French]
L'invention concerne un appareil de polissage et un procédé de polissage. Le procédé de polissage comprend les étapes suivantes : placer un substrat à polir dans une chambre de polissage ; ajouter un fluide de polissage non chimiquement actif et sans abrasif à la chambre de polissage, et permettre au substrat d'être immergé dans le fluide de polissage, de telle sorte que le fluide de polissage exerce une pression de fluide verticale sur la surface du substrat ; déplacer le substrat dans un plan dans lequel se trouve la surface du substrat, de telle sorte que le fluide de polissage effectue une coupe induite par fluide sur une saillie sur la surface du substrat ; et continuer, avec le fluide de polissage, à effectuer en continu une coupe induite par fluide sur la saillie pour retirer la saillie, ce qui permet d'obtenir un polissage de la surface du substrat. La présente invention peut éviter d'endommager des surfaces de substrats en raison d'un polissage, ce qui permet de protéger efficacement les substrats, d'améliorer efficacement la qualité de polissage et d'obtenir un polissage de haute précision. De manière correspondante, la présente invention concerne également un appareil de polissage.[Chinese]
一种抛光装置及抛光方法,该抛光方法包括以下步骤:将待抛光的基板放置于抛光腔室中;向抛光腔室中添加非化学活性且无磨料的抛光流体,使抛光流体浸没基板,以使抛光流体对基板的表面施加垂直流体压力;在基板的表面所处的平面内移动基板,以使抛光流体磨切基板的表面上的凸起;保持抛光流体持续磨切凸起以去除凸起,抛光基板的表面。本发明可以避免抛光对基板的表面造成损伤,有效保护基板,能够有效提高抛光质量,实现高精度抛光。相应地,本发明还提供一种抛光装置。