WO2025000214 - CABINET X-RAY SYSTEMS WITH DISPLAYED MAGNIFICATION AND SPECIMEN POSITION ON TRAY
National phase entry:
Publication Number
WO/2025/000214
Publication Date
02.01.2025
International Application No.
PCT/CN2023/102604
International Filing Date
27.06.2023
Title **
[English]
CABINET X-RAY SYSTEMS WITH DISPLAYED MAGNIFICATION AND SPECIMEN POSITION ON TRAY
[French]
SYSTÈMES À RAYONS X D'ARMOIRE AVEC GROSSISSEMENT AFFICHÉ ET POSITION D'ÉCHANTILLON SUR PLATEAU
Applicants **
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
B507, Block A And B, Nanshan Medical Device Industrial Park, Nanhai Avenue 1019, Nanshan District
Shenzhen, Guangdong 518000, CN
Inventors
ZHANG, Shuai
B507, Block A And B, Nanshan Medical Device Industrial Park, Nanhai Avenue 1019, Nanshan District
Shenzhen, Guangdong 518000, CN
LIU, Yanqing
B507, Block A And B, Nanshan Medical Device Industrial Park, Nanhai Avenue 1019, Nanshan District
Shenzhen, Guangdong 518000, CN
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
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International Searching Authority |
CNIPA
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| Applicant's Legal Status |
Legal Entity
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| * | |
| * | |
| * | |
| * | |
| Entry into National Phase under |
Chapter I
* |
| Translation |
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Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing | 1287 | |
| EPO | Filing, Examination | 9275 | |
| Japan | Filing | 587 | |
| South Korea | Filing | 482 | |
| USA | Filing, Examination | 3510 |
Total: 15141 USD
The term for entry into the National Phase has expired. This quotation is for informational purposes only
Abstract[English]
A cabinet X-ray system(100) having a chamber(110), an imaging subsystem(120+130), a tray(140) configured to support a specimen(190) in the chamber(110) and configured to be at any of M, M is greater than 1, positions (positions_i, i=1, …, M) in the chamber(110), and a controller(160). For each value of i, with the tray(140) being at the position_i, at least 2 pattern spots Xi and Yi on the tray(140) are in a field of view of the imaging subsystem(120+130). The controller(160) is configured to, for each value of i, locate 2 images respectively of Xi and Yi in an image_i of the tray(140) captured by the imaging subsystem(120+130) when the tray(140) is at the position_i, determine a pattern distance_i between the 2 images of Xi and Yi in the image_i in terms of imaging subsystem(120+130) pixels, and determine a magnification_i based on the pattern distance_i.[French]
Un système à rayons X d'armoire (100) possédant une chambre (110), un sous-système d'imagerie (120 + 130), un plateau (140) configuré pour supporter un échantillon (190) dans la chambre (110) et configuré pour être à l'un quelconque de M, M est supérieur à 1, des positions (positions_i, i = 1, ..., M) dans la chambre (110), et un dispositif de commande (160). Pour chaque valeur d'i, le plateau (140) étant à la position_i, au moins 2 points de motif Xi et Yi sur le plateau (140) sont dans un champ de vision du sous-système d'imagerie (120 + 130). Le dispositif de commande (160) est configuré pour, pour chaque valeur d'i, localiser respectivement 2 images de Xi et Yi dans une image i du plateau (140) capturée par le sous-système d'imagerie (120 + 130) lorsque le plateau (140) est à la position_i, déterminer une distance de motif_i entre les 2 images de Xi et Yi dans l'image_i en termes de pixels de sous-système d'imagerie (120 + 130), et déterminer un grossissement_i sur la base de la distance de motif_i.