WO2024124397 - SEMICONDUCTOR X-RAY DETECTOR
National phase entry is expected:
Publication Number
WO/2024/124397
Publication Date
20.06.2024
International Application No.
PCT/CN2022/138636
International Filing Date
13.12.2022
Title **
[English]
SEMICONDUCTOR X-RAY DETECTOR
[French]
DÉTECTEUR DE RAYONS X À SEMI-CONDUCTEUR
Applicants **
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Inventors
CAO, Peiyan
XU, Ning
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
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| Number of Office Actions | * |
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International Searching Authority |
CNIPA
* |
| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
* |
| Type of Assignment |
The Standard Agent's Assignment
* |
| Applicant's Legal Status |
Legal Entity
* |
| * | |
| * | |
| * | |
| * | |
| * | |
| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| Translation |
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* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2452 | |
| EPO | Filing, Examination, Granting | 24649 | |
| Japan | Filing, Examination, Granting | 2961 | |
| South Korea | Filing, Examination, Granting | 3575 | |
| USA | Filing, Examination, Granting | 12940 |
Total:
46,577
The term for entry into the National Phase has expired. This quotation is for informational purposes only
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Abstract[English]
An apparatus suitable for detecting X-ray, having an X-ray absorption layer with an electrode, a first voltage comparator to compare a voltage of the electrode to a first threshold, a second voltage comparator to compare the voltage to a second threshold, a counter to register a number of X-ray photons absorbed by the X-ray absorption layer and a controller. The controller starts a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold. The controller adjusts the second threshold by the voltage at an expiration of the time delay, if the second voltage comparator determines that the absolute value of the voltage does not equal or exceed the absolute value of the second threshold during the time delay.[French]
Appareil approprié pour détecter des rayons X, présentant une couche d'absorption de rayons X avec une électrode, un premier comparateur de tension pour comparer une tension de l'électrode à un premier seuil, un second comparateur de tension pour comparer la tension à un second seuil, un compteur pour enregistrer un certain nombre de photons de rayons X absorbés par la couche d'absorption de rayons X et un dispositif de commande. Le dispositif de commande démarre un retard temporel à partir d'un moment où le premier comparateur de tension détermine qu'une valeur absolue de la tension est supérieure ou égale à une valeur absolue du premier seuil. Le dispositif de commande ajuste le second seuil par la tension à une expiration du retard temporel, si le second comparateur de tension détermine que la valeur absolue de la tension n'est pas supérieure ou égale à la valeur absolue du second seuil pendant le retard temporel.