WO2023160133 - A DIFFERENTIAL LIGHT-SECTION LINE-SCANNING PROFILOMETRY BASED ON MULTI-ANGLE PROJECTION OF INCOHERENT LIGHT SOURCES
National phase entry is expected:
Publication Number
WO/2023/160133
Publication Date
31.08.2023
International Application No.
PCT/CN2022/138508
International Filing Date
13.12.2022
Title **
[English]
A DIFFERENTIAL LIGHT-SECTION LINE-SCANNING PROFILOMETRY BASED ON MULTI-ANGLE PROJECTION OF INCOHERENT LIGHT SOURCES
[French]
PROFILOMÉTRIE DIFFÉRENTIELLE À BALAYAGE LINÉAIRE DE SECTION DE LUMIÈRE BASÉE SUR LA PROJECTION MULTI-ANGLES DE SOURCES DE LUMIÈRE INCOHÉRENTES
Applicants **
XU, Yixin
Inventors
XU, Yixin
Priority Data
202210188214.0
28.02.2022
CN
Application details
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International Searching Authority |
CNIPA
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| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
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| Applicant's Legal Status |
Natural Person
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| Entry into National Phase under |
Chapter II
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| Patent Delivery |
Send the Letters Patent by Courier
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Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 1576 | |
| EPO | Filing, Examination, Granting | 8683 | |
| Japan | Filing, Examination, Granting | 1875 | |
| South Korea | Filing, Examination, Granting | 1538 | |
| USA | Filing, Examination, Granting | 6540 |
Total:
20,212
The term for entry into the National Phase has expired. This quotation is for informational purposes only
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Abstract[English]
A differential light-section line-scanning profilometry based on multi-angle projection of incoherent light sources (200a, 200b) is provided. It can realize high-speed and high-accuracy measurement. A incoherent line light source (10) and its light-path are provided in place of conventional laser light source. It can solve the problem of the low measurement accuracy caused by speckle which caused by laser projection onto high reflectance object surface. A dual-wavelength differential module (20) and its light-path are provided. It can project brighter and sharper scan-line to improve the measurement speed and accuracy. In order to overcome influence of shadow occlusion, multi-angle capture modules (61, 63, 65, 67) are integrated with multi-angle projection modules (60, 62, 64, 66). It can take complete 3D reconstruction for micro objects such as bump, solder ball.[French]
L'invention concerne une profilométrie différentielle à balayage linéaire de section de lumière basée sur une projection multi-angles de sources de lumière incohérentes (200a, 200b). La profilométrie permet de réaliser une mesure à grande vitesse et avec une grande précision. L'invention concerne une source de lumière linéaire incohérente (10) et son trajet lumineux en remplacement d'une source de lumière laser classique. Cela permet de résoudre le problème de la faible précision de mesure due au chatoiement provoqué par la projection laser sur une surface d'objet à réflectance élevée. L'invention concerne également un module différentiel à double longueur d'onde (20) et son trajet lumineux. Le module permet de projeter des lignes de balayage plus lumineuses et plus nettes afin d'améliorer la vitesse et la précision de la mesure. Afin de surmonter l'influence de l'occultation des ombres, des modules de capture multi-angles (61, 63, 65, 67) sont intégrés à des modules de projection multi-angles (60, 62, 64, 66). Une reconstruction complète en 3D peut être réalisée pour des micro-objets tels qu'un bossage ou une perle de soudure.