WO2024031595 - RADIATION DETECTING SYSTEMS WITH MEASUREMENT RESULTS ADJUSTED ACCORDING TO RADIATION SOURCE INTENSITIES
National phase entry is expected:
Publication Number
WO/2024/031595
Publication Date
15.02.2024
International Application No.
PCT/CN2022/111958
International Filing Date
12.08.2022
Title **
[English]
RADIATION DETECTING SYSTEMS WITH MEASUREMENT RESULTS ADJUSTED ACCORDING TO RADIATION SOURCE INTENSITIES
[French]
SYSTÈMES DE DÉTECTION DE RAYONNEMENT À RÉSULTATS DE MESURE ADAPTÉS EN FONCTION D'INTENSITÉS DE SOURCE DE RAYONNEMENT
Applicants **
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Inventors
CAO, Peiyan
LIU, Yurun
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
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| Number of Office Actions | * |
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International Searching Authority |
CNIPA
* |
| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
* |
| Type of Assignment |
The Standard Agent's Assignment
* |
| Applicant's Legal Status |
Legal Entity
* |
| * | |
| * | |
| * | |
| * | |
| * | |
| Entry into National Phase under |
Chapter I
* |
| Patent Delivery |
Send the Letters Patent by Courier
* |
| Translation |
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* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2015 | |
| EPO | Filing, Examination, Granting | 18218 | |
| Japan | Filing, Examination, Granting | 2586 | |
| South Korea | Filing, Examination, Granting | 2814 | |
| USA | Filing, Examination, Granting | 6340 |
Total:
31,973
The term for entry into the National Phase has expired. This quotation is for informational purposes only
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Abstract[English]
A system (500) including a radiation source (520) configured to send an excitation radiation beam (525e) from the radiation source (520) toward an object (540) thereby causing emission of XRF radiation (545) from the object (540), and configured to send a control radiation beam (525c) from the radiation source (520). The system (500) is configured to determine an apparent intensity of the XRF radiation (545), to determine a control intensity of the control radiation beam (525c), and to determine a normalized intensity of the XRF radiation based on the apparent intensity of the XRF radiation (545) and the control intensity of the control radiation beam (525c).[French]
Système (500) comprenant une source de rayonnement (520) configurée pour envoyer un faisceau de rayonnement d'excitation (525e) à partir de la source de rayonnement (520) vers un objet (540), ce qui provoque l'émission d'un rayonnement XRF (545) à partir de l'objet (540), et configurée pour envoyer un faisceau de rayonnement de commande (525c) à partir de la source de rayonnement (520). Le système (500) est configuré pour déterminer une intensité apparente du rayonnement XRF (545), pour déterminer une intensité de commande du faisceau de rayonnement de commande (525c), et pour déterminer une intensité normalisée du rayonnement XRF sur la base de l'intensité apparente du rayonnement XRF (545) et de l'intensité de commande du faisceau de rayonnement de commande (525c).