WO2023141911 - METHOD AND SYSTEM FOR PERFORMING DIFFRACTOMETRY
National phase entry:
Publication Number
WO/2023/141911
Publication Date
03.08.2023
International Application No.
PCT/CN2022/074467
International Filing Date
28.01.2022
Title **
[English]
METHOD AND SYSTEM FOR PERFORMING DIFFRACTOMETRY
[French]
PROCÉDÉ ET SYSTÈME POUR RÉALISER UNE DIFFRACTOMÉTRIE
Applicants **
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
B507, Block A And B, Nanshan Medical Device Industrial Park, Nanhai Avenue 1019, Nanshan District
Shenzhen, Guangdong 518000, CN
Inventors
CAO, Peiyan
B507, Block A And B, Nanshan Medical Device Industrial Park, Nanhai Avenue 1019, Nanshan District
Shenzhen, Guangdong 518000, CN
LIU, Yurun
B507, Block A And B, Nanshan Medical Device Industrial Park, Nanhai Avenue 1019, Nanshan District
Shenzhen, Guangdong 518000, CN
FU, Xian
B507, Block A And B, Nanshan Medical Device Industrial Park, Nanhai Avenue 1019, Nanshan District
Shenzhen, Guangdong 518000, CN
CAO, Yuanjie
B507, Block A And B, Nanshan Medical Device Industrial Park, Nanhai Avenue 1019, Nanshan District
Shenzhen, Guangdong 518000, CN
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
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| * | |
International Searching Authority |
CNIPA
* |
| Applicant's Legal Status |
Legal Entity
* |
| * | |
| * | |
| * | |
| * | |
| Entry into National Phase under |
Chapter I
* |
| Translation |
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Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing | 1273 | |
| EPO | Filing, Examination | 9868 | |
| Japan | Filing | 589 | |
| South Korea | Filing | 482 | |
| USA | Filing, Examination | 3310 |
Total: 15522 USD
The term for entry into the National Phase has expired. This quotation is for informational purposes only
Abstract[English]
Disclosed herein is a method for performing diffractometry. The method includes: sending a first radiation beam toward an object; capturing, with first portions respectively of active areas of an image sensor, images of a diffraction pattern resulting from the first radiation beam being diffracted by the object; sending a second radiation beam toward calibration patterns; capturing, with second portions respectively of the active areas of the image sensor, an image of the calibration patterns based on an interaction between the second radiation beam and the calibration patterns, wherein each portion of the second portions captures an image of at least a calibration pattern of the calibration patterns; and determining a crystal structure of the object based on the images of the diffraction pattern and the image of the calibration patterns. The first portions and the second portions do not overlap.[French]
Est divulgué un procédé de réalisation d'une diffractométrie. Le procédé consiste : à envoyer un premier faisceau de rayonnement vers un objet ; à capturer, avec des premières parties constituant respectivement des zones actives d'un capteur d'image, des images d'un motif de diffraction résultant du premier faisceau de rayonnement qui est diffracté par l'objet ; à envoyer un second faisceau de rayonnement vers des motifs d'étalonnage ; à capturer, avec des secondes parties constituant respectivement des zones actives du capteur d'image, une image des motifs d'étalonnage sur la base d'une interaction entre le second faisceau de rayonnement et les motifs d'étalonnage, chaque partie des secondes parties capturant une image d'au moins un motif d'étalonnage des motifs d'étalonnage ; et à déterminer une structure cristalline de l'objet sur la base des images du motif de diffraction et de l'image des motifs d'étalonnage. Les premières parties et les secondes parties ne se chevauchent pas.