WO2023108549 - INSPECTING TOOL FOR INSPECTING MICRO LED ARRAY PANEL
National phase entry:
Publication Number
WO/2023/108549
Publication Date
22.06.2023
International Application No.
PCT/CN2021/138838
International Filing Date
16.12.2021
Title **
[English]
INSPECTING TOOL FOR INSPECTING MICRO LED ARRAY PANEL
[French]
OUTIL D'INSPECTION POUR INSPECTER UN PANNEAU DE RÉSEAU MICRO-DEL
Applicants **
JADE BIRD DISPLAY (SHANGHAI) LIMITED
Inventors
XU, Chenchao
YUE, Yang
LI, Qiming
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
| * | |
| Number of Office Actions | * |
| * | |
International Searching Authority |
CNIPA
* |
| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
* |
| Type of Assignment |
The Standard Agent's Assignment
* |
| Applicant's Legal Status |
Legal Entity
* |
| * | |
| * | |
| * | |
| * | |
| * | |
| Entry into National Phase under |
Chapter I
* |
| Patent Delivery |
Send the Letters Patent by Courier
* |
| Translation |
|
* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 1752 | |
| EPO | Filing, Examination, Granting | 12798 | |
| Japan | Filing, Examination, Granting | 2340 | |
| South Korea | Filing, Examination, Granting | 2311 | |
| USA | Filing, Examination, Granting | 4740 |
Total:
23,941
The term for entry into the National Phase has expired. This quotation is for informational purposes only
Contact Us
Abstract[English]
An inspecting tool for inspecting a micro LED array panel (00) includes: an optical collector group (01) configured to collect light emitted from a micro LED array included in the micro LED array panel (00); an image detector (02) connected with the optical collector group (01) to receive the light collected by the optical collector group (01), and configured to capture an image of the micro LED array; and a light measuring device (03) electrically connected with the optical collector group (01) receive the light collected by the optical collector group (01), and configured to measure the light emitted from one or more portions of the micro LED array. The optical collector group (01) is configured to receive the light emitted from any position of the micro LED array.[French]
L'invention concerne un outil d'inspection permettant d'inspecter un panneau de réseau micro-DEL (00), comprenant : un groupe collecteur optique (01) conçu pour collecter la lumière émise à partir d'un réseau micro-DEL inclus dans le panneau de réseau micro-DEL (00) ; un détecteur d'image (02) connecté au groupe collecteur optique (01) pour recevoir la lumière collectée par le groupe collecteur optique (01), et conçu pour capturer une image du réseau micro-DEL ; et un dispositif de mesure de lumière (03) connecté électriquement au groupe collecteur optique (01) pour recevoir la lumière collectée par le groupe collecteur optique (01), et conçu pour mesurer la lumière émise par une ou plusieurs parties du réseau micro-DEL. Le groupe collecteur optique (01) est conçu pour recevoir la lumière émise à partir de n'importe quelle position du réseau micro-DEL.