WO2023108547 - SYSTEM FOR CONSTRUCTING DEFECT LEVEL CLASSIFICATION MODEL
National phase entry:
Publication Number
WO/2023/108547
Publication Date
22.06.2023
International Application No.
PCT/CN2021/138835
International Filing Date
16.12.2021
Title **
[English]
SYSTEM FOR CONSTRUCTING DEFECT LEVEL CLASSIFICATION MODEL
[French]
SYSTÈME DE CONSTRUCTION D'UN MODÈLE DE CLASSIFICATION DE NIVEAU DE DÉFAUT
Applicants **
JADE BIRD DISPLAY (SHANGHAI) LIMITED
7F, No. 11, 13, Lane 99, Haiyang 4th Road, Lin-gang Special Area, China (Shanghai) Pilot Free Trade Zone
Pudong New Area, Shanghai 201306, CN
Inventors
XU, Chenchao
7F, No. 11, 13, Lane 99, Haiyang 4th Road, Lin-gang Special Area, China (Shanghai) Pilot Free Trade Zone
Pudong New Area, Shanghai 201306, CN
YUE, Yang
7F, No. 11, 13, Lane 99, Haiyang 4th Road, Lin-gang Special Area, China (Shanghai) Pilot Free Trade Zone
Pudong New Area, Shanghai 201306, CN
LI, Qiming
7F, No. 11, 13, Lane 99, Haiyang 4th Road, Lin-gang Special Area, China (Shanghai) Pilot Free Trade Zone
Pudong New Area, Shanghai 201306, CN
Application details
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International Searching Authority |
CNIPA
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| Applicant's Legal Status |
Legal Entity
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| Entry into National Phase under |
Chapter I
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| Translation |
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Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing | 1304 | |
| EPO | Filing, Examination | 9626 | |
| Japan | Filing | 590 | |
| South Korea | Filing | 482 | |
| USA | Filing, Examination | 3710 |
Total: 15712 USD
The term for entry into the National Phase has expired. This quotation is for informational purposes only
Abstract[English]
A method of constructing a defect level classification model of a micro LED array panel includes: defining a defect classification rule for classifying pixel defects; detecting a pixel defect of the micro LED array panel; identifying a pixel defect type of the detected pixel defect according to the defect classification rule; and, identifying a defect level of the micro LED array panel according to a defect level classification rule and the identified pixel defect type.[French]
Un procédé de construction d'un modèle de classification de niveau de défaut d'un panneau de réseau de micro-DEL comprend les étapes consistant à : définir une règle de classification de défauts pour classifier des défauts de pixel ; détecter un défaut de pixel du panneau de réseau de micro-DEL ; identifier un type de défaut de pixel du défaut de pixel détecté en fonction de la règle de classification de défaut ; et identifier un niveau de défaut du panneau de réseau de micro-DEL selon une règle de classification de niveau de défaut et le type de défaut de pixel identifié.