WO2023070647 - SCAN CIRCUIT AND DISPLAY APPARATUS
National phase entry:
Publication Number
WO/2023/070647
Publication Date
04.05.2023
International Application No.
PCT/CN2021/127843
International Filing Date
01.11.2021
Title **
[English]
SCAN CIRCUIT AND DISPLAY APPARATUS
[French]
CIRCUIT DE BALAYAGE ET APPAREIL D'AFFICHAGE
Applicants **
BOE TECHNOLOGY GROUP CO., LTD.
No.10 Jiuxianqiao Rd., Chaoyang District
Beijing 100015, CN
CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
No.1188 Hezuo Rd., (West Zone), Hi-tech Development Zone
Chengdu, Sichuan 611731, CN
Inventors
HUANG, Yao
No.9 Dize Rd., BDA
Beijing 100176, CN
LI, Meng
No.9 Dize Rd., BDA
Beijing 100176, CN
CHENG, Tianyi
No.9 Dize Rd., BDA
Beijing 100176, CN
KIM, Doyoung
No.9 Dize Rd., BDA
Beijing 100176, CN
MA, Long
No.9 Dize Rd., BDA
Beijing 100176, CN
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
| * | |
| * | |
International Searching Authority |
CNIPA
* |
| Applicant's Legal Status |
Legal Entity
* |
| * | |
| * | |
| * | |
| * | |
| Entry into National Phase under |
Chapter I
* |
| Translation |
|
Recalculate
* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing | 1509 | |
| EPO | Filing, Examination | 10241 | |
| Japan | Filing | 591 | |
| South Korea | Filing | 482 | |
| USA | Filing, Examination | 3110 |
Total: 15933 USD
The term for entry into the National Phase has expired. This quotation is for informational purposes only
Abstract[English]
A scan circuit and a display apparatus. The scan circuit includes a plurality of stages. A respective stage of the scan circuit includes a second processing subcircuit (PSC2), which includes a first capacitor (C1), a sixth transistor (T6), and a seventh transistor (T7). The respective stage of the scan circuit further includes a sixth connecting line (Cln6) connecting a first electrode (S7) of the seventh transistor (T7), a second electrode (D6) of the sixth transistor (T6), and a second capacitor electrode (Ce1-2) of the first capacitor (C1) together. The sixth connecting line (Cln6) crosses over both the first capacitor electrode (Ce1-1) and the second capacitor electrode (Ce1-2) of the first capacitor (C1).[French]
La présente invention concerne un circuit de balayage et un appareil d'affichage. Le circuit de balayage comprend une pluralité d'étages. Un étage respectif du circuit de balayage comprend un deuxième sous-circuit de traitement (PSC2) qui comprend un premier condensateur (C1), un sixième transistor (T6) et un septième transistor (T7). L'étage respectif du circuit de balayage comprend en outre une sixième ligne de connexion (Cln6) qui connecte ensemble une première électrode (S7) du septième transistor (T7), une deuxième électrode (D6) du sixième transistor (T6) et une deuxième électrode de condensateur (Ce1-2) du premier condensateur (C1). La sixième ligne de connexion (Cln6) passe par-dessus la première électrode de condensateur (Ce1-1) et la deuxième électrode de condensateur (Ce1-2) du premier condensateur (C1).