WO2024111186 - MEASUREMENT CHIP, MEASURING DEVICE AND MEASURING METHOD
National phase entry:
Publication Number
WO/2024/111186
Publication Date
30.05.2024
International Application No.
PCT/JP2023/030418
International Filing Date
24.08.2023
Title **
[English]
MEASUREMENT CHIP, MEASURING DEVICE AND MEASURING METHOD
[French]
PUCE DE MESURE, DISPOSITIF DE MESURE ET PROCÉDÉ DE MESURE
Applicants **
FURUNO ELECTRIC CO., LTD.
Inventors
TADA Keiji
KAWAJIRI Takeshi
KAJI Syoichiro
Priority Data
2022-188273
25.11.2022
JP
Application details
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International Searching Authority |
IP India
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| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
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| Applicant's Legal Status |
Legal Entity
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| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| 译文 |
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Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2163 | |
| EPO | Filing, Examination, Granting | 11730 | |
| Japan | Filing, Examination, Granting | 2154 | |
| South Korea | Filing, Examination, Granting | 2132 | |
| USA | Filing, Examination, Granting | 4740 |
Total:
22,919
The term for entry into the National Phase has expired. This quotation is for informational purposes only
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Abstract[English]
Embodiments of present disclosure provide an optical waveguide type measurement chip (1) with further improved measurement stability, a measurement device (10) and a measurement method. The measurement chip comprises a propagation layer (2) configured to allow light to propagate, an introductory part (3) configured to have a first diffraction grating for introducing the light into the propagation layer, an outgoing part (4) configured to have a second diffraction grating for deriving the light from the propagation layer, and a ligand modification surface configured to be a surface of the propagation layer and capable of modifying a ligand (72) that reacts with an analyte (75) be detected, wherein a period of a plurality of grating patterns (31, 41) formed in at least one of: the first diffraction grating, or the second diffraction grating, is different from each other between two or more regions.[French]
Des modes de réalisation de la présente divulgation concernent une puce de mesure de type à guide d'ondes optique (1) ayant une stabilité de mesure encore améliorée, un dispositif de mesure (10) et un procédé de mesure. La puce de mesure comprend une couche de propagation (2) configurée pour permettre à la lumière de se propager, une partie d'introduction (3) configurée pour avoir un premier réseau de diffraction pour introduire la lumière dans la couche de propagation, une partie sortante (4) configurée pour avoir un second réseau de diffraction pour dériver la lumière de la couche de propagation, et une surface de modification de ligand configurée pour être une surface de la couche de propagation et capable de modifier un ligand (72) qui réagit avec un analyte (75) est détectée, une période d'une pluralité de motifs de réseau (31, 41) formés dans au moins l'un parmi : le premier réseau de diffraction, ou le second réseau de diffraction, est différent l'un de l'autre entre deux régions ou plus.