WO2026139859 - MASS CALIBRATION
National phase entry is expected:
Publication Number
WO/2026/139859
Publication Date
02.07.2026
International Application No.
PCT/IB2025/063338
International Filing Date
22.12.2025
Title **
[English]
MASS CALIBRATION
[French]
ÉTALONNAGE DE MASSE
Applicants **
DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
Inventors
BLOOMFIELD, Nicholas G.
Priority Data
63/738,602
24.12.2024
US
63/793,968
24.04.2025
US
Application details
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International Searching Authority |
EPO
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| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
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| Applicant's Legal Status |
Legal Entity
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| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| 译文 |
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Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2240 | |
| EPO | Filing, Examination, Granting | 11365 | |
| Japan | Filing, Examination, Granting | 2377 | |
| South Korea | Filing, Examination, Granting | 2578 | |
| USA | Filing, Examination, Granting | 4740 |
Total:
23,300
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Abstract[English]
In one aspect, a mass calibration method for use in mass spectrometry is disclosed, which includes generating a plurality of mass spectra corresponding to at least two calibrant ions having different m/z ratios for a plurality of different intensities of said at least two calibrant ions, using the mass spectra to determine an m/z ratio for each of said calibrant ions and for each of said ion intensities. For each of said calibrant ions and each of said ion intensities, a shift of said determined m/z ratio is determined relative to the m/z ratio of that calibrant ion and the m/z shifts are used to generate an intensity-dependent correction factor for correcting a measured m/z ratio of a target ion associated with an analyte in a sample.[French]
Selon un aspect, l'invention divulgue un procédé d'étalonnage de masse destiné à être utilisé en spectrométrie de masse, qui consiste à générer une pluralité de spectres de masse correspondant à au moins deux ions d'étalonnage ayant différents rapports m/z pour une pluralité d'intensités différentes desdits au moins deux ions d'étalonnage, en utilisant des spectres de masse pour déterminer un rapport m/z pour chacun desdits ions d'étalonnage et pour chacune desdites intensités d'ions. Pour chacun desdits ions d'étalonnage et chacune desdites intensités d'ions, un décalage dudit rapport m/z déterminé est déterminé par rapport au rapport m/z de cet ion d'étalonnage et les m/z décalages sont utilisés pour générer un facteur de correction dépendant de l'intensité pour corriger un rapport m/z mesuré d'un ion cible associé à un analyte dans un échantillon.