WO2026022540 - SODIUM ANALYSIS METHOD
National phase entry is expected:
Publication Number
WO/2026/022540
Publication Date
29.01.2026
International Application No.
PCT/IB2025/056214
International Filing Date
18.06.2025
Title **
[English]
SODIUM ANALYSIS METHOD
[French]
PROCÉDÉ D'ANALYSE DE SODIUM
Applicants **
PRECISION PLANTING LLC
Inventors
FITZJARRALD, Tamara
NELSON, Rachel
Priority Data
63/675,398
25.07.2024
US
Application details
| Total Number of Claims/PCT | * |
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International Searching Authority |
EPO
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| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
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| Applicant's Legal Status |
Legal Entity
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| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| 译文 |
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** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 1880 | |
| EPO | Filing, Examination, Granting | 8126 | |
| Japan | Filing, Examination, Granting | 1846 | |
| South Korea | Filing, Examination, Granting | 1443 | |
| USA | Filing, Examination, Granting | 4740 |
Total:
18,035
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Abstract[English]
A method of measuring sodium ion concentration in a sample including: providing an analysis sample; processing the analysis sample through an analysis device that vaporizes the analysis sample and provides emission spectra; measuring a first emission intensity at 589 nm and a second emission intensity at 819 nm for sodium ions; if the first emission intensity at 589 nm is not saturated, obtaining a sodium ion concentration from the first emission intensity at 589 nm; and if the first emission intensity at 589 nm is saturated, obtaining the sodium ion concentration from the second emission intensity at 819 nm.[French]
L'invention concerne un procédé de mesure de la concentration d'ions sodium dans un échantillon comprenant : la fourniture d'un échantillon d'analyse ; le traitement de l'échantillon d'analyse par l'intermédiaire d'un dispositif d'analyse qui vaporise l'échantillon d'analyse et fournit des spectres d'émission ; la mesure d'une première intensité d'émission à 589 nm et d'une seconde intensité d'émission à 819 nm pour des ions sodium ; si la première intensité d'émission à 589 nm n'est pas saturée, l'obtention d'une concentration d'ions sodium à partir de la première intensité d'émission à 589 nm ; et si la première intensité d'émission à 589 nm est saturée, l'obtention de la concentration d'ions sodium à partir de la seconde intensité d'émission à 819 nm.