WO2025229425 - IMAGE-BASED INSPECTION DEVICE
National phase entry is expected:
Publication Number
WO/2025/229425
Publication Date
06.11.2025
International Application No.
PCT/IB2025/053231
International Filing Date
27.03.2025
Title **
[English]
IMAGE-BASED INSPECTION DEVICE
[French]
DISPOSITIF D'INSPECTION BASÉ SUR DES IMAGES
Applicants **
FOSS ANALYTICAL A/S
Inventors
HØJER SANDERS, Nicolai
DREIER, Erik Schou
Priority Data
PA202430208
30.04.2024
DK
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
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| Number of Office Actions | * |
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International Searching Authority |
EPO
* |
| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
* |
| Type of Assignment |
The Standard Agent's Assignment
* |
| Applicant's Legal Status |
Legal Entity
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| * | |
| * | |
| * | |
| * | |
| * | |
| Entry into National Phase under |
Chapter I
* |
| Patent Delivery |
Send the Letters Patent by Courier
* |
| 译文 |
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* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2053 | |
| EPO | Filing, Examination, Granting | 8624 | |
| Japan | Filing, Examination, Granting | 2183 | |
| South Korea | Filing, Examination, Granting | 2133 | |
| USA | Filing, Examination, Granting | 4740 |
Total:
19,733
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Abstract[English]
Imaged Based Inspection Device An image-based inspection device (2) comprises a transparent portion (4) for receiving grains to be inspected, as received grains; an imaging system (6) configured to capture a plurality of spatially co- registered images of the received grains, as captured images, each of which is an image of the received grains illuminated at a different illumination angle; an image processor (8) connected to the imaging system (6) for processing the captured images by combining them to form a composite image in which artifacts caused by the illumination at the different illumination angles are minimised; and an inspection unit (10) operable to receive the composite image and to apply one or more image evaluation algorithms to determine thereby visual characteristics of individual grains of the received grains in the composite image.[French]
Dispositif (2) d'inspection basé sur des images comprenant une partie transparente (4) destinée à recevoir des grains à inspecter, en tant que grains reçus; un système (6) d'imagerie configuré pour capturer une pluralité d'images spatialement alignées entre elles des grains reçus, en tant qu'images capturées, dont chacune est une image des grains reçus éclairés sous un angle d'éclairage différent; un processeur (8) d'images connecté au système (6) d'imagerie pour traiter les images capturées en les combinant pour former une image composite dans laquelle des artéfacts provoqués par l'éclairage aux différents angles d'éclairage sont minimisés; et une unité (10) d'inspection utilisable pour recevoir l'image composite et pour appliquer un ou plusieurs algorithmes d'évaluation d'image afin de déterminer ainsi des caractéristiques visuelles de grains individuels des grains reçus dans l'image composite.