WO2026027901 - GENERALISED PARAMETER SHIFT WITH BOSON SAMPLING
National phase entry is expected:
Publication Number
WO/2026/027901
Publication Date
05.02.2026
International Application No.
PCT/GB2025/051723
International Filing Date
01.08.2025
Title **
[English]
GENERALISED PARAMETER SHIFT WITH BOSON SAMPLING
[French]
DÉCALAGE DE PARAMÈTRE GÉNÉRALISÉ AVEC ÉCHANTILLONNAGE DE BOSONS
Applicants **
ORCA COMPUTING LIMITED
Inventors
FACELLI, Giorgio
ROBERTS, David
CLEMENTS, William
WALLNER, Hugo
Priority Data
2411418.3
02.08.2024
GB
2413523.8
13.09.2024
GB
Application details
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International Searching Authority |
EPO
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| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
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| Applicant's Legal Status |
Legal Entity
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| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| 译文 |
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Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2212 | |
| EPO | Filing, Examination, Granting | 10176 | |
| Japan | Filing, Examination, Granting | 2277 | |
| South Korea | Filing, Examination, Granting | 2351 | |
| USA | Filing, Examination, Granting | 4740 |
Total:
21,756
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Abstract[English]
Methods are provided for configuring a boson sampler, the boson sampler comprising a light source, a reconfigurable interferometer having one or more configurable elements, and one or more photodetectors. The method comprises determining a partial derivative of an expected value of an observable with respect to a parameter of a configurable element of the boson sampler. The method further comprises configuring a configurable element of the boson sampler based on the determined partial derivative.[French]
L'invention concerne des procédés de configuration d'un échantillonneur de bosons, l'échantillonneur de bosons comprenant une source de lumière, un interféromètre reconfigurable ayant un ou plusieurs éléments configurables, et un ou plusieurs photodétecteurs. Le procédé consiste à déterminer une dérivée partielle d'une valeur attendue d'un observable par rapport à un paramètre d'un élément configurable de l'échantillonneur de bosons. Le procédé consiste en outre à configurer un élément configurable de l'échantillonneur de bosons sur la base de la dérivée partielle déterminée.