WO2024239222 - CABINET X-RAY SYSTEM WITH ROTATABLE SPECIMEN TRAY
National phase entry:
Publication Number
WO/2024/239222
Publication Date
28.11.2024
International Application No.
PCT/CN2023/095690
International Filing Date
23.05.2023
Title **
[English]
CABINET X-RAY SYSTEM WITH ROTATABLE SPECIMEN TRAY
[French]
SYSTÈME À RAYONS X AVEC PLATEAU D'ÉCHANTILLON ROTATIF
Applicants **
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Inventors
ZHANG, Shuai
YAN, Jingyang
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
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| Pages of Specification | * |
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| Number of Office Actions | * |
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International Searching Authority |
CNIPA
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| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
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| Applicant's Legal Status |
Legal Entity
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| * | |
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| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| 译文 |
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Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 1804 | |
| EPO | Filing, Examination, Granting | 14056 | |
| Japan | Filing, Examination, Granting | 2374 | |
| South Korea | Filing, Examination, Granting | 2456 | |
| USA | Filing, Examination, Granting | 4740 |
Total:
25,430
The term for entry into the National Phase has expired. This quotation is for informational purposes only
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Abstract[English]
A cabinet x-ray system (100) may include a chamber (110), an X-ray source (120) that directs an X-ray beam into the chamber (110), an X-ray detector (130) and a tray system (140). The tray system (140) supports a specimen (190) in the chamber (110) and is able to rotate relative to the chamber (110) about an axis parallel to the tray (142). The X-ray detector (130) captures an image of the specimen (190) based on an interaction between the specimen (190) and the X-ray beam.[French]
La présente invention concerne un système à rayons X (100) qui peut comprendre une chambre (110), une source de rayons X (120) qui dirige un faisceau de rayons X dans la chambre (110), un détecteur de rayons X (130) et un système de plateau (140). Le système de plateau (140) supporte un échantillon (190) dans la chambre (110) et peut tourner par rapport à la chambre (110) autour d'un axe parallèle au plateau (142). Le détecteur de rayons X (130) capture une image de l'échantillon (190) sur la base d'une interaction entre l'échantillon (190) et le faisceau de rayons X.