WO2026003609 - METHOD AND DEVICE FOR DETERMINING A HEIGHT MAP
National phase entry is expected:
Publication Number
WO/2026/003609
Publication Date
02.01.2026
International Application No.
PCT/IB2025/055436
International Filing Date
27.05.2025
Title **
[English]
METHOD AND DEVICE FOR DETERMINING A HEIGHT MAP
[French]
PROCÉDÉ ET DISPOSITIF DE DÉTERMINATION D'UNE CARTE DE HAUTEUR
Applicants **
MITUTOYO CORPORATION
Inventors
REDLARSKI, Lukasz
Priority Data
24184028.9
24.06.2024
EP
Application details
| Total Number of Claims/PCT | * |
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| Number of Multi-Dependent Claims | * |
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International Searching Authority |
EPO
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| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
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| Applicant's Legal Status |
Legal Entity
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| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| Translation |
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* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2023 | |
| EPO | Filing, Examination, Granting | 8143 | |
| Japan | Filing, Examination, Granting | 2181 | |
| South Korea | Filing, Examination, Granting | 2043 | |
| USA | Filing, Examination, Granting | 4740 |
Total:
19,130
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Abstract[English]
The current invention relates to a method for determining a height map of a sample surface of a sample. The invention further relates to a method for determining a height map of a sample surface comprising a pre-scan step and a high-accuracy scan step. The invention further relates to an optical profilometry device configured for determining a height map of the sample surface. The invention further relates to a computer readable data carrier comprising a computer program.[French]
La présente invention concerne un procédé de détermination d'une carte de hauteur d'une surface d'échantillon d'un échantillon. L'invention concerne en outre un procédé de détermination d'une carte de hauteur d'une surface d'échantillon comprenant une étape de pré-balayage et une étape de balayage de haute précision. L'invention concerne en outre un dispositif de profilométrie optique conçu pour déterminer une carte de hauteur de la surface d'échantillon. L'invention concerne en outre un support de données lisible par ordinateur comprenant un programme informatique.