WO2024184790 - ELECTRICAL STIMULATION SYSTEM FAULT DIAGNOSTICS
National phase entry is expected:
Publication Number
WO/2024/184790
Publication Date
12.09.2024
International Application No.
PCT/IB2024/052076
International Filing Date
04.03.2024
Title **
[English]
ELECTRICAL STIMULATION SYSTEM FAULT DIAGNOSTICS
[French]
DIAGNOSTIC DE DÉFAUT DE SYSTÈME DE STIMULATION ÉLECTRIQUE
Applicants **
COCHLEAR LIMITED
Inventors
MACFARLANE, Rachel
CONNOLLY, Samantha
Priority Data
63/489,304
09.03.2023
US
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
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| Number of Office Actions | * |
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International Searching Authority |
MOIP
* |
| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
* |
| Type of Assignment |
The Standard Agent's Assignment
* |
| Applicant's Legal Status |
Legal Entity
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| * | |
| * | |
| * | |
| * | |
| * | |
| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| Translation |
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* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 3475 | |
| EPO | Filing, Examination, Granting | 29740 | |
| Japan | Filing, Examination, Granting | 3170 | |
| South Korea | Filing, Examination, Granting | 2961 | |
| USA | Filing, Examination, Granting | 10740 |
Total:
50,086
The term for entry into the National Phase has expired. This quotation is for informational purposes only
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Abstract[English]
Presented herein are techniques for assessing proper functioning of an implantable component, such as an implantable medical device. In particular, an implant diagnostic system (integrity testing system) is configured to diagnose faults associated within an implantable electrical stimulation system. In certain embodiments, the implantable electrical stimulation system includes a plurality of stimulating electrodes configured to be implanted at a first location (first anatomical region) of a recipient. The integrity testing system includes one or more recording electrodes positioned at a second location (second anatomical region) of the recipient. The second location is a location that enables use of the one or more recording electrodes to detect phase reversals and other anomalous voltage patterns.[French]
L'invention concerne des techniques pour évaluer le fonctionnement correct d'un composant implantable, tel qu'un dispositif médical implantable. En particulier, un système de diagnostic d'implant (système de test d'intégrité) est configuré pour diagnostiquer des défauts associés à l'intérieur d'un système de stimulation électrique implantable. Dans certains modes de réalisation, le système de stimulation électrique implantable comprend une pluralité d'électrodes de stimulation configurées pour être implantées à un premier emplacement (première région anatomique) d'un receveur. Le système de test d'intégrité comprend une ou plusieurs électrodes d'enregistrement positionnées à un second emplacement (seconde région anatomique) du receveur. Le second emplacement est un emplacement qui permet l'utilisation de la ou des électrodes d'enregistrement pour détecter des inversions de phase et d'autres motifs de tension anormale.