WO2024028714 - PULSED LASER DIODE DRIVER CURRENT MEASUREMENT CIRCUIT
National phase entry is expected:
Publication Number
WO/2024/028714
Publication Date
08.02.2024
International Application No.
PCT/IB2023/057648
International Filing Date
27.07.2023
Title **
[English]
PULSED LASER DIODE DRIVER CURRENT MEASUREMENT CIRCUIT
[French]
CIRCUIT DE MESURE DE COURANT D'ATTAQUE DE DIODE LASER PULSÉE
Applicants **
SILANNA ASIA PTE LTD
Inventors
COLLES, Joseph H.
ROSENBAUM, Steven E.
MOLIN, Stuart B.
Priority Data
63/370,271
03.08.2022
US
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
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| Number of Pages with Drawings | * |
| Pages of Specification | * |
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| Number of Office Actions | * |
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International Searching Authority |
MOIP
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| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
* |
| Type of Assignment |
The Standard Agent's Assignment
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| Applicant's Legal Status |
Legal Entity
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| * | |
| * | |
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| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| Translation |
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* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2268 | |
| EPO | Filing, Examination, Granting | 12254 | |
| Japan | Filing, Examination, Granting | 2291 | |
| South Korea | Filing, Examination, Granting | 1823 | |
| USA | Filing, Examination, Granting | 4740 |
Total:
23,376
The term for entry into the National Phase has expired. This quotation is for informational purposes only
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Abstract[English]
A pulsed laser diode driver includes a laser diode switch and a bypass switch to control a current flow through an inductor to produce a high-current pulse through a laser diode, the high-current pulse corresponding to a peak current of a resonant waveform developed at an anode of the laser diode. A current pulse measurement circuit receives a sense voltage developed at a sense resistance and generates, based on the sense voltage, a current sense signal that corresponds to the peak current amplitude of the high-current pulse through the laser diode.[French]
Un circuit d'attaque de diode laser pulsée comprend un commutateur à diode laser et un commutateur de dérivation pour commander un flux de courant à travers une bobine d'induction pour produire une impulsion de courant élevé à travers une diode laser, l'impulsion de courant élevé correspondant à un courant de crête d'une forme d'onde résonante développée au niveau d'une anode de la diode laser. Un circuit de mesure d'impulsion de courant reçoit une tension de détection développée à une résistance de détection et génère, sur la base de la tension de détection, un signal de détection de courant qui correspond à l'amplitude de courant de crête de l'impulsion de courant élevé à travers la diode laser.