WO2023175452 - CALIBRATION TARGET, FOURIER PTYCHOGRAPHIC IMAGING SYSTEM AND METHOD FOR CALIBRATING A FOURIER PTYCHOGRAPHIC IMAGING SYSTEM
National phase entry:
Publication Number
WO/2023/175452
Publication Date
21.09.2023
International Application No.
PCT/IB2023/052233
International Filing Date
09.03.2023
Title **
[English]
CALIBRATION TARGET, FOURIER PTYCHOGRAPHIC IMAGING SYSTEM AND METHOD FOR CALIBRATING A FOURIER PTYCHOGRAPHIC IMAGING SYSTEM
[French]
CIBLE D'ÉTALONNAGE, SYSTÈME D'IMAGERIE PTYCHOGRAPHIQUE DE FOURIER ET PROCÉDÉ D'ÉTALONNAGE D'UN SYSTÈME D'IMAGERIE PTYCHOGRAPHIQUE DE FOURIER
Applicants **
SIEMENS HEALTHCARE DIAGNOSTICS INC.
Inventors
ENGEL, Thomas
Priority Data
22162680.7
17.03.2022
EP
Application details
| Total Number of Claims/PCT | * |
| Number of Independent Claims | * |
| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
| Pages for Publication | * |
| Number of Pages with Drawings | * |
| Pages of Specification | * |
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| Number of Office Actions | * |
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International Searching Authority |
EPO
* |
| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
* |
| Applicant's Legal Status |
Legal Entity
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| * | |
| * | |
| * | |
| * | |
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| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| Translation |
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Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2026 | |
| EPO | Filing, Examination, Granting | 8131 | |
| Japan | Filing, Examination, Granting | 2161 | |
| South Korea | Filing, Examination, Granting | 2056 | |
| USA | Filing, Examination, Granting | 4740 |
Total:
19,114
The term for entry into the National Phase has expired. This quotation is for informational purposes only
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Abstract[English]
The invention relates to a calibration target (1) for a Fourier ptychographic imaging system (100), comprising at least a first plane (2) and a second plane (4), wherein the first plane (2) and the second plane (4) are parallel to each other and comprise a predefined distance (d, 2a) between each other, wherein the first plane (2) comprises a first calibration structure (22) and the second plane (4) comprises a second calibration structure (24), wherein the first calibration structure (22) is configured to be suitable for centering itself in relation to an optical component (14) and/or a ccaammeerraa (12) of the Fourier ptychographic imaging system (100), and wherein the second calibration structure (24) is configured to be suitable for determining, directly or in projection onto the first plane (2), a position of at least one characteristic or predetermined feature of the first calibration structure (22).[French]
L'invention concerne une cible d'étalonnage (1) pour un système d'imagerie ptychographique de Fourier (100), comprenant au moins un premier plan (2) et un second plan (4), le premier plan (2) et le second plan (4) étant parallèles l'un à l'autre et comprenant une distance prédéfinie (d, 2a) entre eux, le premier plan (2) comprenant une première structure d'étalonnage (22) et le second plan (4) comprenant une seconde structure d'étalonnage (24), la première structure d'étalonnage (22) étant conçue pour être appropriée pour se centrer elle-même par rapport à un composant optique (14) et/ou à une caméra (12) du système d'imagerie ptychographique de Fourier (100), et la seconde structure d'étalonnage (24) étant conçue pour être appropriée pour déterminer, directement ou en projection sur le premier plan (2), une position d'au moins une caractéristique ou particularité prédéterminée de la première structure d'étalonnage (22).