WO2025238025 - METHOD AND SYSTEM FOR MEASURING THE FREQUENCY OF A WAVEFORM AND/OR ITS DERIVATIVE
National phase entry is expected:
Publication Number
WO/2025/238025
Publication Date
20.11.2025
International Application No.
PCT/EP2025/063104
International Filing Date
13.05.2025
Title **
[English]
METHOD AND SYSTEM FOR MEASURING THE FREQUENCY OF A WAVEFORM AND/OR ITS DERIVATIVE
[French]
PROCÉDÉ ET SYSTÈME DE MESURE DE LA FRÉQUENCE D'UNE FORME D'ONDE ET/OU DE SA DÉRIVÉ
Applicants **
ROMERO GORDON, José María
Inventors
ROMERO GORDON, José María
Priority Data
24175565.1
13.05.2024
EP
Application details
| Total Number of Claims/PCT | * |
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| Number of Multi-Dependent Claims | * |
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International Searching Authority |
EPO
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| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
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| Applicant's Legal Status |
Natural Person
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| * | |
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| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| Translation |
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* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2305 | |
| EPO | Filing, Examination, Granting | 8380 | |
| Japan | Filing, Examination, Granting | 2325 | |
| South Korea | Filing, Examination, Granting | 2359 | |
| USA | Filing, Examination, Granting | 5340 |

Total:
20,709
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Abstract[English]
A method and system for measuring the frequency and/or derivative of a waveform. The method comprises establishing a plurality of crossover levels; comparing the waveform with each of the crossover levels and generating measurement functions, wherein each measurement function has a rising edge at a first level and a falling edge at a second level which change according to the coincidence of the waveform with its crossover level and a hysteresis condition; recording, for each measurement function, a plurality of values; applying a statistical calculation on the set of all values between two given instants, in order to estimate the frequency of the waveform and/or its derivative between those instants. The waveform may be derived from an analogue input signal.[French]
Procédé et système de mesure de la fréquence et/ou de la dérivée d'une forme d'onde. Le procédé consiste à établir une pluralité de niveaux de seuil ; à comparer la forme d'onde avec chacun des niveaux de seuil et à générer des fonctions de mesure, chaque fonction de mesure présentant un front montant à un premier niveau et un front descendant à un second niveau qui varie en fonction de la coïncidence de la forme d'onde avec son niveau de seuil et d'une condition d'hystérésis ; à enregistrer, pour chaque fonction de mesure, une pluralité de valeurs ; à appliquer un calcul statistique sur l'ensemble de toutes les valeurs entre deux instants donnés, afin d'estimer la fréquence de la forme d'onde et/ou sa dérivée entre ces instants. La forme d'onde peut être dérivée d'un signal d'entrée analogique.