WO2026025437 - SCAN CIRCUIT AND DISPLAY APPARATUS
National phase entry is expected:
Publication Number
WO/2026/025437
Publication Date
05.02.2026
International Application No.
PCT/CN2024/109146
International Filing Date
01.08.2024
Title **
[English]
SCAN CIRCUIT AND DISPLAY APPARATUS
[French]
CIRCUIT DE BALAYAGE ET APPAREIL D'AFFICHAGE
Applicants **
BOE TECHNOLOGY GROUP CO., LTD.
BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD.
Inventors
SHANG, Guangliang
LU, Jiangnan
ZHU, Jianchao
HUANG, Yinglong
LIU, Libin
HU, Ming
WANG, Dawei
Application details
| Total Number of Claims/PCT | * |
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| Number of Priorities | * |
| Number of Multi-Dependent Claims | * |
| Number of Drawings | * |
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| Number of Pages with Drawings | * |
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| Number of Office Actions | * |
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International Searching Authority |
CNIPA
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| Recordal of a Change of the Applicant's Name/Address |
Change of Applicant's Name and Address
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| Type of Assignment |
The Standard Agent's Assignment
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| Applicant's Legal Status |
Legal Entity
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| * | |
| * | |
| * | |
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| Entry into National Phase under |
Chapter I
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| Patent Delivery |
Send the Letters Patent by Courier
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| Translation |
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* The data is based on automatic recognition. Please verify and amend if necessary.
** IP-Coster compiles data from publicly available sources. If this data includes your personal information, you can contact us to request its removal.
Quotation for National Phase entry
| Country | Stages | Total | |
|---|---|---|---|
| China | Filing, Examination, Granting | 2362 | |
| EPO | Filing, Examination, Granting | 16414 | |
| Japan | Filing, Examination, Granting | 2327 | |
| South Korea | Filing, Examination, Granting | 2350 | |
| USA | Filing, Examination, Granting | 5190 |
Total:
28,643
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Abstract[English]
A scan circuit is provided. The scan circuit includes a plurality of scan units. A respective scan unit of the plurality of scan units includes an input subcircuit configured to control voltages of a second node in response at least in part to a signal provided to an input terminal; and an output subcircuit configured to supply a high voltage signal or a low voltage signal to an output terminal. At least one of subcircuits of the respective scan unit includes an anti-leakage switch. The anti-leakage switch includes a first electrode and a second electrode. The anti-leakage switch is configured to receive a first gate control signal, a second gate control signal, a first gate voltage adjustment signal, and a second gate voltage adjustment signal.[French]
L'invention concerne un circuit de balayage. Le circuit de balayage comprend une pluralité d'unités de balayage. Une unité de balayage respective de la pluralité d'unités de balayage comprend un sous-circuit d'entrée configuré pour commander des tensions d'un second nœud en réponse au moins en partie à un signal fourni à une borne d'entrée ; et un sous-circuit de sortie configuré pour fournir un signal haute tension ou un signal basse tension à une borne de sortie. Au moins l'un des sous-circuits de l'unité de balayage respective comprend un commutateur antifuite. Le commutateur antifuite comprend une première électrode et une seconde électrode. Le commutateur antifuite est configuré pour recevoir un premier signal de commande de grille, un second signal de commande de grille, un premier signal de réglage de tension de grille et un second signal de réglage de tension de grille.